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Local Influence on Optical Properties and Thickness of ITO-Films by Means of Plasma Flow
Microstructured lipid bilayers
Graphene and Graphene Oxide
Technology ellipsometry with the example graphene
Dispersion Functions Manual
Functional Coatings on Cantilevers
Laser Diodes
EP³ SPR
Characterization of an anisotropic film
Effective medium approach for nanoparticles in colloidal and photonic crystals
Mapping of a thick transparent layer
Microcontact Printed Monolayers inspected with Imaging Ellipsometry and Scanning Probe Microscopy
Thickness measurement of SiO2 layer on Si-wafer.
Micropatterned Polymer Films
Characterization of glass micro array
Kinetic Binding Studies using OptiSlides
Characterisation of bulk-heterojunction layers for solar cell application
Real-time monitoring of polyelectrolyte-multilayer growth onto tantalum pentoxide (Ta2O5) by internal reflection ellipsometry
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Technology ellipsometry with the example graphene
ABSTRACT
Presentation about the principles of imaging elipsometry and the application example: graphene-pinpointing and ellipsometric characterization
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