Imaging Ellipsometry overcomes the limits of classical ellipsometers by determing film thickness and optical properties by combining nulling ellipsometry with microscopy. You receive ellipsometric high contrast images from the surface with highest lateral resolution down to 1µm. Spectroscopic ellipsometry enables you studying complex materials like polymer surfaces, graphene, monolayer, biosensors, proteins, colloids and many more.
nanofilm_ep3sw
Single Wavelength Imaging Ellipsometer for investigation of structured ultra thin films
nanofilm_ep3se
Spectroscopic Imaging Ellipsometer for investigation of complex structured ultra thin films
Technical integration – AFM
The pachage include the technical integration of an AFM...
Technical integration THz TDS
Terahertz time-domain spectroscopy (THz-TDS) is a spectroscopic technique.
application package SPR
Multi– Channel and Imaging Surface Plasmon Resonance Analyser