Home
|
Sitemap
|
Contact
|
Impressum
Surface and Thin Film Characterization
Active Vibration Isolation
Service / Support
Company
News
News
News
Nanopticum
Compendium
Exhibitions
Seminars
Principles of Nulling and Imaging Ellipsometry
Introduction
Polarization of light
Nulling ellipsometry
Optical modeling
Imaging ellipsometry
The focus scanner
Download
Principles of Nulling and Imaging Ellipsometry
Principles of Brewser angle microscopy
Introduction
Brewster´s law
Brewster angle microscopy
Instrumentation
Application
Download
Principles of Brewser angle microscopy
Principles of Halcyonics Active Vibration Isolation Technology
Introduction
Active vibration isolation (AVI)
Active vibration control (AVC)
Technology of halcyonics systems
Download
Comparison between nanofilm_ep3bam and nanofilm_ultrabam
Introduction
Optical system
Mechanical properties
Software
Upgrade and options
Download
Comparison between nanofilm_ep3bam and nanofilm_ultrabam
Dispersion function of refractive index and extinction coefficient
Introduction
Cauchy function
Cauchy-Urbach
Sellmeier term
Pole_UV, Pole_IR
Lorentz oscillator
Tauc_Lorentz, Tauc_Lorentz_Urbach, Cody_Lorentz
Drude
Forouhi-Bloomer
Download
Dispersion function of refractive index and extinction coefficient
Imaging ellipsometry - Ellipsometric Accuracy of the nanofilm_ep3 series
Accuracy, precision, repeatability & reproducibility
Delta & psi, resolution and sensitivity
Accuracy in film thickness or refractive index
Precision vs. ROI size
Precision vs. magnification
Drift
4-zone vs. 1-zone nulling
Map homogenity
Calibration
Download
Imaging ellipsometry - Ellipsometric Accuracy of the nanofilm_ep3 series