ABSTRACT
Conductive polymers and polymer-fullerene blends are promising materials for OLED and plastic solar cell applications. Blends prepared by two different methods, silk-printing and spin-coating were imaged, characterized and mapped using the spectroscopic imaging ellipsometer nanofilm_ep3se at two magnifications, 10X and 2X. The mean value of the layer thickness and the optical properties of selected regions of interest were obtained from UV/VIS spectra of Delta and Psi. The local distribution and location of optical properties was obtained from delta maps.
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