Application Overview Halcyonics Products: SNOM
Please be aware that this list will not show a complete overview of technologies and products within this technologies. We want to provide an overview for technologies and products where we have made experiences over the last 15 years.
If your application is missing or differs from shown applications or if you have different experiences, we would highly appreciate your comment.
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Scanning Probe Microscope - SPM: SNOM
Near-field scanning optical microscopy (NSOM/SNOM) is a microscopic technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves. This is done by placing the detector very close (distance much smaller than wavelength λ) to the specimen surface. This allows for the surface inspection with high spatial, spectral and temporal resolving power. With this technique, the resolution of the image is limited by the size of the detector aperture and not by the wavelength of the illuminating light. In particular, lateral resolution of 20 nm and vertical resolution of 2–5 nm have been demonstrated As in optical microscopy, the contrast mechanism can be easily adapted to study different properties, such as refractive index, chemical structure and local stress. Dynamic properties can also be studied at a sub-wavelength scale using this technique.