Application Overview Halcyonics Products: Scanning Electron Microscopy - SEM
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Scanning Electron Microscopy - SEM
An electron microscope is a type of microscope that uses a particle beam of electrons to illuminate the specimen and produce a magnified image. Electron microscopes (EM) have a greater resolving power than a light-powered optical microscope, because electrons have wavelengths about 100,000 times shorter than visible light (photons), and can achieve better than 50 pm resolution.
The electron microscope uses electrostatic and electromagnetic "lenses" to control the electron beam and focus it to form an image. These lenses are analogous to, but different from the glass lenses of an optical microscope that form a magnified image by focusing light on or through the specimen.
Established types of electron microscopes are:
- Transmission electron microscope (TEM)
- Scanning electron microscope (SEM)
- Reflection electron microscope (REM)
- Scanning transmission electron microscope (STEM)
- Low-voltage electron microscope (LVEM)
There are also several spcial set ups in the market, such as: HeIM Helium ion microscope (SHIM), Focused Ion Beam (FIB), Field Emission Gun (FEG), Field Emission (FE)