At the air/water interface, Ellipsometry and Brewster angle microscopy are state-of-the-art techniques for metrology and imaging of thin films.
Imaging Ellipsometry is the method of choice to measure thin film thickness and optical properties of structured layers typically found at the air/water interface.
application package Imaging ellipsometry at the air/water interface
The application package consists of the following components, suited to specific needs for air/water interface:
- z-lift
- Laser saftey cabinet
- halcyonics_variobasic 40
- halcyonics_supportframe_bam/ie
- nanofilm_LBbam
Application_package Water/air-interface